The AINA group focuses on the development of scientific instruments based on charged particle beams for nano-imaging and nano-analysis and correlative workflows taking advantage of these instruments. This research activity, which includes fundamentals, instrumentation and applications, aims at turning innovative ideas and concepts into instrumental prototypes. The group’s current R&D activities focus on correlative Microscopy (nano-analytics combining high-lateral resolution and high-sensitivity chemical analysis; techniques and instruments developed by AINA include integrated TEM-SIMS, HIM-SIMS and SPM-SIMS), the development of compact high-performance mass spectrometers and secondary ion mass spectrometry systems (commercialised as add-on systems on high-end instruments), the optimisation of sensitivity and quantification in SIMS, the development of ion sources and the investigation of ion – matter interactions.
Dr Tom WIRTZ is the Head of the Advanced Instrumentation for Ion Nano-Analytics (AINA) Group at the Luxembourg Institute of Science and Technology (LIST). He holds a PhD degree in materials science from the Institut National Polytechnique de Lorraine and a Habilitation obtained for his work on ion beam instrumentation. He is (co)author of 110 refereed articles in international journals, two book chapters and 9 patents.